软件缺陷发现时序过程的叠加双阻尼振荡模型 - 软件学报.pdf

See discussions, stats, and author profiles for this publication at: /publication/271231576 Accumulative Bi-Damped Oscillation Model for the Sequential Process of Software Defect Discovery Article in Journal of Software December 2011 DOI: 10.3724/SP.J.1001.2010.03691 CITATIONS READS 3 15 3 authors, including: Zhitao He Beihang University (BUAA) 7 PUBLICATIONS 12 CITATIONS SEE PROFILE All content following this page was uploaded by Zhitao He on 14 June 2015. The user has requested enhancement of the downloaded file. ISSN 1000-9825, CODEN RUXUEW E-mail: jos@ Journal of Software , Vol.21, No.12, December 2010, pp.2999−3010 doi: 10.3724/SP.J.1001.2010.03691 Tel/Fax: +86-10 © by Institute of Software , the Chinese Academy of Sciences . All rights reserved. ∗ 软件缺陷发现时序过程的叠加双阻尼振荡模型 + 何智涛 , 晏海华, 刘 超 (北京航空航天大学 计算机学院,北京 100191) Accumulative Bi-Damped Oscillation Model for the Sequential Process of Software Defect Discovery + HE Zhi-Tao , YAN Hai-Hua, LIU Chao (School of Computer Science and Engineering, BeiHang University, Beijing 100191, China) + Corresponding author: E-mail: zhitaohe@ He ZT, Yan HH, Liu C. Accumulative bi-damped oscillation model for the sequential process of software defect discovery. Journal of Software, 2010,21(12):2999−3010. /1000-9825/ 3691.htm Abstract : In software testing practice, usually, the software under test (SUT) experiences multiple iterative processes of testing and modification. With the influence of many unce