纳米技术与系统3扫描探针显微镜SPM系统.PPTVIP

磁性微探针。探测记录样品表面的磁分布。如磁盘、磁带。 10.5 磁力显微镜(MFM) The AFM operated in the non-contact mode with a magnetic cantilever detects a force gradient (F) containing information from both the surface structure and surface magnetization. F = Fsurface+Fmagnetic Signals from surface topography dominate at close distances to the surface while, at greater distances from the surface (typically beyond 100 nm), the magnetic signal dominates. Consequently, depending on the distance between the surface and the tip, normal MFM images may contain a combination of topography and magnetic signals. Though it is useful to topographically locate where the magnetic domains are, sometimes it is more advantageous to completely separate the two signals from each other. F = Fsurface+Fmagnetic Magnetic force microscopy ? Local magnetic properties ? AFM + tip covered by a layer of ferromagnetic material with specific magnetization 材 料：单晶硅 形 状：圆锥形 针尖高度：7 ?m 针尖曲率：10 nm 圆 锥 角：10? Tip preparation of MFM（a） A typical example is shown in the picture. A carbon contamination needle is grown on top of the pyramidal tip of a commercial Si3N4 AFM cantilever. The needle is covered afterwards from one side with a thermally evaporated 15 nm thick Co80Ni20 film to make it sensitive for MFM mea- surement. Orientation of the needle is chosen to be approximately 10o with respect to the can- tilever plane. Tip preparation of MFM（b） MFM的应用实例 Magnetic Force Microscopy (MFM) uses a combination of TappingMode?, LiftMode? and a properly prepared tip to gather information about the magnetic field above a sample. Each line of the sample is ?rst scanned in TappingMode operation to obtain the sample topography. The topographic information is stored and retraced with a user selectable height offset in LiftMode, during which the magnetic data are collected. Typical lift heights in MFM range from 20- 100 nm. 磁力显微镜(MFM)实例 V I micropipette sample (cathode)