applicant and examiner citations in us patents an overview：申请人和考官在美国专利中的引用概述精品.pdfVIP

Applicant and Examiner Citations in US Patents: An Overview and Analysis Juan Alcácer Michelle Gittelman Bhaven Sampat Working Paper 09-016 Copyright © 2008 by Juan Alcácer, Michelle Gittelman, and Bhaven Sampat Working papers are in draft form. This working paper is distributed for purposes of comment and discussion only. It may not be reproduced without permission of the copyright holder. Copies of working papers are available from the author. Applicant and Examiner Citations in US Patents: An Overview and Analysis July 2008 Juan Alcácer Michelle Gittelman Bhaven Sampat Harvard Business School Rutgers Business School Malman School of Public jalcacer@ Rutgers University Health michelle.gittelman@business. Columbia University bns3@ Abstract Researchers studying innovation increasingly use indicators based on patent citations. However, it is well known that not all citations originate from applicants— patent examiners contribute to citations listed in issued patents—and that this could complicate interpretation of findings in this literature. In 2001 the US Patent and Trademark Office (USPTO) began reporting examiner and applicant citations separately. In this paper, we analyze t