An independent component analysis-based filter design for defect detection in low-contrast surface i.pdf

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An independent component analysis-based filter design for defect detection in low-contrast surface i.pdf

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An independent component analysis-based filter design for defect detection in low-contrast surface i

Pattern Recognition 39 (2006) 1679–1694 /locate/patcog An independent component analysis-based filter design for defect detection in low-contrast surface images Du-Ming Tsai?, Ping-Chieh Lin, Chi-Jie Lu Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Nei-Li, Tao-Yuan, Taiwan, ROC Received 7 September 2005; received in revised form 8 February 2006; accepted 8 March 2006 Abstract In this paper, we propose a convolution filtering scheme for detecting small defects in low-contrast uniform surface images and, especially, focus on the applications for backlight panels and glass substrates found in liquid crystal display (LCD) manufacturing. A defect embedded in a low-contrast surface image shows no distinct intensity from its surrounding region, and even worse, the sensed image may present uneven brightness on the surface. All these make the defect detection in low-contrast surface images extremely difficult. In this study, a constrained independent component analysis (ICA) model is proposed to design an optimal filter with the objective that the convolution filter will generate the most representative source intensity of the background surface without noise. The prior constraint incorporated in the ICA model confines the source values of all training image patches of a defect-free image within a small interval of control limits. In the inspection process, the same control parameter used in the constraint is also applied to set up the thresholds that make impulse responses of all pixels in faultless regions within the control limits, and those in defective regions outside the control limits. A stochastic evolutionary computation algorithm, particle swarm optimization (PSO), is applied to solve for the constrained ICA model. Experimental results have shown that the proposed method can effectively detect small defects in low-contrast backlight panels and LCD glass substrate images. 2006 Pattern Recognition Society. Published by