Comparison of electromigration performance for Pb-free solders and surface finishes with Ni UBM.pdfVIP
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Comparison of electromigration performance for Pb-free solders and surface finishes with Ni UBM
Comparison of Electromigration Performance for Pb-free Solders
and Surface Finishes with Ni UBM
Minhua Lu, Paul Lauro, Da-Yuan Shih, Robert Polastre, Charles Goldsmith*, Donald W. Henderson*,
Hongqing Zhang+, Moon Gi Cho#
IBM T. J. Watson Research Center
Yorktown Heights, NY 10598
*IBM Microelectronics
Hopewell Junction, NY
+Lehigh University
Department of Material Sciences Engineering
Bethlehem, PA 18015
#Korea Advanced Institute of Science and Technology
Department of Material Science Engineering, Daejon, Korea
Abstract
A series of electromigration (EM) experiments were
undertaken to evaluate the time to failure performance of
solder joints comprised of Sn-Ag and Sn-Cu alloys in
combination with three solderable surface finishes, Cu, Ni-Au
and Ni-Cu. The opposing pad structure in the solder joints
was the same in all experiments and was comprised of a
layered structure, simulating Ni based under – bump –
metallurgies (UBM) for controlled collapse chip connection
(C4). As anticipated the Sn grain size was large with the
typical solder joint containing only a few grains. In all
experiments, reported here, the electron current exited the pad
with the surface finish under evaluation and passed into the
solder. Two failure modes were identified. The manifested
failure mode depended on the orientation of the c-axis of the
larger Sn grains in the solder joint with respect to the applied
current direction. When the c-axis is not closely aligned with
the current direction, cavitation at solder-IMC interface leads
to electrical failure. A more rapid failure mode occurred when
the c-axis was closely aligned with the current direction. With
this alignment the interfacial IMC structures were swept away
by rapid diffusive processes from the pad surface and the pad
material was quickly consumed. Interfacial void formation
leads to rapid failure in this mode. The Sn-Ag solder appeared
to demonstrate greater microstructural stabi
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