JET2000 slide with Alchemist III.pptVIP

JET TECHNOLOGY CO., LTD .tw High Performance Digital Electronics Expanded Test Applications Digital IC Test Standard Library (~ 40,000 Model) User Library IC Tester Pattern or Simulation Pattern ROM/FPGA/PAL Pattern Xpress Model Pattern Boundary Scan Pattern Nand Tree Pattern Open Xpress Junction Xpress Modeling Service Automatic, Multi-level Device Isolation - Disable / Inhibit Xpress Model Fast Model creation Simple Data entry ( Spreadsheet ) Basic Input Data Functional Verification Boundary Scan Test Nand Tree Test Bus Tests Automatically Generated Pin/Device Level Visibility Prevents False Failures Reduced Repair Costs Programmable Devices Alchemist III for Repair Autodebug fast Program generation Rule Based Debugging Routine-Work done by Computer better Program Quality Easy to Use Graphical Debug Display Fault Coverage Report Ultra Pin Features New Features Voltage Swing +5.5V to -2.5V ±50mV Accuracy 26 Logic Families (A-Z) Programmable Slew 50-300 V/μS 16K Memory Standard Vectors 64K Memory Bscan Vectors 600ma Drive Current PU and PD 2.1K Ultra Pin Cards Features Continued Short Circuit Protection Pin Tri-States if Current 750ma Software Override Overvoltage Protection -2.5v and +5.5v D/S Disconnect Relays Open No Override Why JET Technology ? Reduction in logic and supply voltages. Voltages decreased Clock and Data rate increased Slew rate and power in a transition has also increased. Low voltage devices are more susceptible to noise. Logic transition produces more current, than older Either overdrive the condition without pluses or Guarantee disables and inhibits as with Ultra Pin Digital Test Stability Evaluation only. Created with Aspose.Slides for .NET 3.5 Client Profile . Copyright 2004-2011 Aspose Pty Ltd. Evaluation only. Created with Aspose.Slides for .NET 3.5 Client Profile . Copyright 2004-2011 Aspose Pty Ltd. Over-voltage Above +5.6V or Below -2.6V Disconnect Relay Opens Short Circuit Current Short in fixture or on the UUT Ba