第0讲课程简介.pptVIP

EE141 EE141 Testing as Filter Process Costs of Testing Design for testability (DFT) Chip area overhead and yield reduction Performance overhead Software processes of test Test generation and fault simulation Test programming and debugging Manufacturing test Automatic test equipment (ATE) capital cost Test center operational cost Roles of Testing Detection: Determination whether or not the device under test (DUT) has some fault. Diagnosis: Identification of a specific fault that is present on DUT. Device characterization: Determination and correction of errors in design and/or test procedure. Failure mode analysis (FMA): Determination of manufacturing process errors that may have caused defects on the DUT. EE141 VLSI测试与可测试性设计 课程导论 * 中科院研究生院课程：VLSI测试与可测试性设计 预讲 课程简介 李晓维 中科院计算技术研究所 Email: lxw@ 基本目的 使学生掌握VLSI系统测试和可测性设计的基本原理和主要方法； 使学生把握VLSI系统测试和可测性设计的学科前沿方向； 使学生对EDA系统中有关测试和可测性设计工具有初步认识和实践体会； 使学生能够在与VLSI测试相关的学术研究和应用开发中直接发挥作用。 L.-T. Wang, C-W Wu, X-Q Wen, VLSI TEST PRINCIPLES AND ARCHITECTURES Design for Testability Elsevier Morgan Kaufmann Publishers, ?2006. M.L.Bushnell and V.D.Agrawal, ESSENTIAL OF ELECTRONIC TESTING for Digital Memory and Mixed-Signal VLSI Circuits, Kluwer Academic Publishers, ?2000. M.Abramovici, M.A.Breuer, A.D.Friedman, Digital Systems Testing and Testable Design, Computer Science Press, ?1995. 参考书 国际学术刊物（/） [1] IEEE Transactions on Computers [2] IEEE Transactions of Computer Aided Design of Integrated Circuits and Systems [4] IEEE Design and Test of Computers [5] Journal of Electronic Testing: Theory and Applications [3] IEEE Transactions on VLSI Systems 主要文献出处 国际学术会议（/tttc） [1] IEEE International Test Conference (ITC) [2] IEEE VLSI Test Symposium (VTS) [3] IEEE Asian Test Symposium (ATS) [4] IEEE Design Automation and Test in Europe (DATE) [5] ACM/IEEE Design Automation Conference (DAC) [6] IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 主要文献出处 国内学术刊物/会议 [1] 《中国科学》 [3] 《计算机学报》 [4] 《