Introduction to AFM Analysis Oxford Materials（介绍AFM分析牛津材料）.pdfVIP

Practical 2P4 Introduction to AFM Analysis What you should learn from the practical: Science: This practical has three parts. In the first you will learn about the basic operation of an atomic force microscope using a standard sample In the second you will study with the AFM the RMS values of roughness on the best polish you can achieve on a metallographic specimen. In the third you will learn how to analyse thermal grooving, which is covered in the Surfaces and Interfaces lecture course. Practical Skills: You will learn how to operate an atomic force microscope, and how to analyse data from AFM images. Safety Considerations: The AFM has a laser which could potentially affect your vision if looked at directly. To avoid this, never rotate the scanner head. 1 2P4 – Intro to AFM Analysis Overview: Day 1: • Learning the basic operation of the AFM and observing. • Polishing silver sample, and analysing rms surface roughness values on polished surface. Overnight: • Annealing silver sample. Day 2: • Observation of thermal grooving in silver sample. Day 3: • Further microscopy if required. The AFM: The AFM is a form of scanning probe microscope developed in the mid 1980s. It works by scanning an extremely fine probe on the end of a cantilever across the surface of a material, profiling the surface by measuring the deflection of the cantilever. This allows a 3D profile of the surface to be produced at magnifications over one million times, giving much more topographical information than optical or scanning electron microscopes. Its limitation is that the surface to be observed needs to be very flat or the tip will crash into the ‘hills’ as it is scanned. 2 2P4 – Intro to AFM Analysis The microscope can run in two modes, contact and close contact. Contact mode scans the p