xrf（X射线荧光光谱法）.docVIP

xrf（X射线荧光光谱法） Light source: SPECTRO XEPOS uses end window PD target 50W ray tube. Up to 8 polarizing targets and secondary targets can be installed, Various excitation conditions can be set to ensure optimum determination of elements from Na to U. Optical gating system: It is possible to ensure that there is no need to turn off the light pipe when the sample is replaced, thereby improving the stability of the system. Detector: The detector adopts the most advanced silicon elegant counter at present. Regardless of counting rate, resolution All stay the same. Specially designed collimator can significantly improve signal to noise ratio (SNR). Spectral resolution is less than 160eV (in Mn Ka line). The maximum count rate was 120000cps. At high count rates, there is still a high resolution, It can shorten the analysis time and improve the accuracy of analysis. Sample Room The unique analytical performance of SPECTRO XEPOS depends not only on its powerful analytical components, but also on its advanced features Polarization technology, but also depends on its accurate sample design. The German Spike analytical instrument company is developing SPECTRO XEPOS takes into account the problem of sampling. High precision sample exchanger and new sample plate It can greatly reduce the impact of mechanical and material fluctuations on the measurement and improve the analysis results. The instrument is equipped with a sample rotating device, The analytical results of heterogeneous samples and uneven surface samples can be further improved. Uninterrupted power supply: It can eliminate the influence of power supply fluctuation and ensure long term stability and long lasting performance of X tube. Software The SPECTRO XEPOS software provides an easy to understand and easy to use interface. Select method, input sample identification Information can be measured. With a complete bootstrap program, the operator can create it only in 5 simple steps New analysis method. The basic parameter