晶体管特性测试仪的使用（The use of transistor characteristics tester）.docVIP

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晶体管特性测试仪的使用（The use of transistor characteristics tester）.doc

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晶体管特性测试仪的使用（The use of transistor characteristics tester）

晶体管特性测试仪的使用（The use of transistor characteristics tester） The use of transistor characteristics tester The knob switch panel, transistor characteristic tester on the typical press function can be divided into 6 parts, namely the oscilloscope and display circuit, power supply, Y collector shaft part and X axis part, correction and conversion part, step signal. The function of main switch and knob of each part is explained as follows (refer to HZ4832 transistor characteristic tester as reference). (1) power supply and oscilloscope tube control part: this part of the use of oscilloscope is identical, not too much introduction. (2) Y axis part Current / degree switch. The utility model is a switch with 25 or 4 deflection functions, and is a range switch for measuring reverse leakage current of diode and collector current of triode. Collector current 20 blocks (10 A/div to 0.5A/div); diode leakage current of 5 blocks (0.2 ~ 5 mu A/div). When the switch is in the base current or voltage source base position, the screen of the Y axis represents the base current or voltage; when the switch is in the external, Y axis system in the receiving state, the external is the rear panel socket directly into the Y axis amplifier, amplified to obtain its deflection value. Y axis shift. It enables the measured signal or collector scan line to move in the Y axis. (3) X axis part Voltage / degree switch. The utility model is a switch with 22 or 4 deflection functions, and is a range switch of the collector voltage and the base voltage. Collector voltage is 12 gears (0.05 ~ 50V/div). When the switch is in the base current or voltage source base position, the screen of the X axis represents the base current or voltage; when the switch is in the external, X axis system in the receiving state, the external is the rear panel Q9 plug directly into the X axis amplifier, amplified to obtain its deflection value. X axis shift. The measured signal or collector scan line can be moved in the directio