医用诊断X射线剂量探测技术概述-中国测试.PDF

31 4 Vol.31　No.4 　2005 7 CHINA MEASUREMENT TECHNOLOGY July, 2005 　　　　　 X 1 1 1 2 杨　勇, 张圆月, 刘志宏, 刘　萍 (1., 610021;2., 250002 ) 　:X , -- , 、, 。 ———X , X 。 :X ;; :R814.2　　　　:A 　　　　:1672-4984(2005)04-0094-03 Introduction of diagnose X-ray dose testing technology 1 1 1 2 YANG Yong , ZHANG Yuan-yue , LIU Zhi-hong , LIU Pin (1.Na ional Ins i u e of Tes ing and Measuremen Technology, Chengdu 610021, China; 2.Yangzhou Bureau of Quali y Technical Supervision, Yangzhou 25002, China) Abstract:This paper in roduces he es ing me hod of diagnose X-ray dose , and discusses he chamber and semiconduc or used in X-ray de ec or heory , s ruc ure and i s charac eris ics.How o selec de ec or for each measure have been sugges ed.A new de ec or mix chamber and semiconduc or can be used es kV、mA、exposure ime、dose and dosera e of X-ray uni discribes subsequen ly. Key words:Diagnose X-ray;Ionix chamber;Semiconduc or de ec or 1　　 , X , , 。, X , 。 , , , , , 。 。 2　 , (DAP )、CT (CTDI ) 2.1　X , X 。, X X , , , , , , 。 。 2002 GB18871-2002《 X 》, , 。 : :2005-01-26;:2005-03-19 DAP = D ·S :(2000