复合绝缘子微波无损检测方法的关键因素研究.PDFVIP

第 43 卷 第 1 期：203-209 高电压技术 Vol.43, No.1: 203-209 2017 年 1 月 31 日 High Voltage Engineering January 31, 2017 DOI: 10.13336/j.1003-6520.hve.20161227027 复合绝缘子微波无损检测方法的关键因素研究 王黎明，李 昂，成 立 518055 （清华大学深圳研究生院，深圳 ） 摘 要：为了减少复合绝缘子缺陷的故障隐患，研究使用微波反射法对复合绝缘子内部缺陷进行检测的方法。该 方法利用微波在绝缘子内部各层交界面的反射特征来进行缺陷检测。采用波阻抗模型进行计算，从理论上验证了 微波检测方法的可行性；采用有限积分法对不同厚度的硅橡胶环氧树脂组合样品进行建模仿真，与实验结果对比， 得到了硅橡胶厚度与微波反射信号强度的对应关系，即幅度衰减的周期性变化规律；采用平板样品进行实验，研 究了缺陷尺寸与检测精度之间的关系，实验中最小可以检测到平板样品内 0.3 mm 深、4 mm 宽的缺陷；提出使用 读数偏移量相对值来判断缺陷的方法，使得本微波检测法可以适用于不同型号的绝缘子。理论和实验结果表明， 采用微波反射法对复合绝缘子缺陷进行检测具有良好的可行性。 关键词：复合绝缘子；无损检测；微波；缺陷；CST 仿真；护套厚度 Key Factors of Microwave Non-destructive Testing on Composite Insulators WANG Liming, LI Ang, CHENG Li (Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China) Abstract ：In order to decrease the hidden faults of the composite insulators, a microwave reflection method was applied to inspect the internal defects. The method inspects the defects by using characteristics of the microwave reflections on interfaces of different layers within the insulators. The wave impedance model was adopted to calculate and examine the feasibility of the method theoretically. Then simulation of silicon rubber in different thickness and epoxy resin samples was done by finite integration technique, and the result passed the experimental tests; therefore, the corresponding rela- tionships between the reflection signal intensity and the thickness of the silicon rubber could be provided, which were cyclical variation of the amplitude attenuation. Besides, the relationship between