Review_Nov_2012_07Nov.pptxVIP

1 The Summary of 2012 Yield Status: OEE improvement /Test time reduction: DBus2_Master: 90.80% 440Ku/M vs.79.89% 270Ku/M in 2011, RKE : 85.80% 90Ku/M vs.85.21% 60Ku/M in 2011. DBus2_Slave: 92.48% 2000Ku/M vs.92.83%1700Ku/M in 2011, 3PPB: 68.74%103Ku/M vs. 74.16%100Ku/M in 2011. The run rate of DBus2_Master is 4 FXPWR. The OEE of 2012 was increased from 58.5% (2011) to 69.8% (Sep 2012). Elimination ECID insertion of DBus2_Master in Jul 2012. Program optimizations and Evaluation: DBus2_Master: X199 (T40097-99) DBus2_Slave: XZ (T8200/1112) 3PP: XX (build SC900798 for Conti) X200 (T2471-74) YA (More changes) XY (DPAT) X201 (EDCI Temp) BI Code 042012 XZ X202 (T6800/6801) BI Code (Vsup26V) APEK R002 BI Code (7hrs duration) Probe TTR program Orion: FXPWR test program SBCLite: FT33889F_2.4 (More changes) Probe T87 evaluation Qual Supporting: DBus2_Master: Fab transfer from CHD to OHT Fab Mars: ATIC51/ATIC55 EPOXY Qual Substrate Injection and Epi Issue(HCL) Orion: 2nd substrate Qual DBus2_Slave: New Golden Wire change Qual 3PPC: Fab transfer from TLS to CHD Fab Fab transfer from CHD to OHT Fab SBCLite: SOIC28 package LF Qual. Supporting MBG: Supporting MBG and Japanese QA for the bench test on CQI 448525A (DBus2_Master) Supporting MBG to analysis and evaluate test limits for CQI case. Adding new containment tests into test program for CQI issue. 2 DBus2_Master Yield Trend in 2012 Scrap ~200K NBTI rejects caused yield drop. Avera