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An improved transient plane source method for measuring thermal conductivity of thin films Deconvoluting thermal contact resistance.pdf

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An improved transient plane source method for measuring thermal conductivity of thin films Deconvoluting thermal contact resistance.pdf

International Journal of Heat and Mass Transfer 96 (2016) 371–380 Contents lists available at ScienceDirect International Journal of Heat and Mass Transfer journal homepage: /locate/ijhmt An improved transient plane source method for measuring thermal conductivity of thin ?lms: Deconvoluting thermal contact resistance Mohammad Ahadi a, Mehdi Andisheh-Tadbir a, Mickey Tam b, Majid Bahrami a,? a Laboratory for Alternative Energy Conversion (LAEC), School of Mechatronic Systems Engineering, Simon Fraser University, Surrey, BC V3T 0A3, Canada b Structure, Properties Performance Research Division, Automotive Fuel Cell Cooperation Corp. (AFCC), 9000 Glenlyon Parkway, Burnaby, BC V5J 5J8, Canada article info Article history: Received 11 November 2015 Received in revised form 1 January 2016 Accepted 13 January 2016 Available online 4 February 2016 Keywords: Thermal conductivity Thin ?lm Transient plane source (TPS) method Thermal contact resistance (TCR) Hot disk thermal constants analyzer Guarded hot plate method abstract The conventional transient plane source (TPS) method cannot accurately measure bulk thermal conductivity of thin ?lms and coatings, because of the inclusion of thermal contact resistances in the results. In this study, a new modi?ed TPS method is proposed that allows accurate measurement of bulk thermal conductivity of thin ?lms and coatings. For this purpose, ?rst, a hot disk testbed is used to measure the total thermal resistance for different thicknesses of a sample in the TPS test column. The bulk thermal conductivity is then deconvoluted from the results. Experiments have been performed on ethylene tetra?uoroethylene (ETFE) sheets, Na?on membranes, and gas diffusion layers (GDLs) with different thicknesses using the proposed method, and the results have been cross-checked with the data obtained from the guarded hot plate method, as per ASTM standard C177-13. The present modi?ed TPS method yields thermal conductivity values of 0.174 ± 0.002 Wámà1áKà1