veeco dimension 3100 afm procedure 操作手册.pdf

VEECO Dimension 3100 Atomic Force Microscope (AFM) Procedure Introduction The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers. Scanning Modes The AFM scans on either Tapping Mode or Contact Mode. Each mode should be selected according to the specimen to be scanned and the kind of results desired. When dealing with a new sample, consult the literature available on AFM microscopy to determine which mode better suits your particular application. At any rate, it is recommended that both modes are tested to verify which produces the best results. For more details on the modes and AFM in general, consult the SPM Training Notebook. 1 AFM Probe Policy The most common kinds of probes are the RTESP probe and the DNP-20 probe, which are recommended for tapping mode and contact mode respectively. AFM probes are fragile and consumable items; they break on a regular basis, particularly when the probe is being mounted on the AFM head. Extra care should be taken during the mounting operation. The NRF will keep a store of these two probes and provide them to the users for an extra charge on machine usage. However, it is strongly recommended that the users buy and use their own probes. That will