Grain size effect of Ni–W–Cu seed layer film upon signal-to-noise ratio for PMR application》.pdfVIP

Vacuum 120 (2015) 27e31 Contents lists available at ScienceDirect Vacuum journal homepage: /locate/vacuum Short communication Grain size effect of NieWeCu seed layer film upon signal-to-noise ratio for PMR application Kun-Ming Chen a, b, Yun-Kai Cheng a, Hao-Chia Liao a, In-Gann Chen b, Weng-Sing Hwang b, * a Solar Applied Materials Technology Corp, No. 1, Gongye 3rd Rd., Annan Dist., Tainan City 70995, Taiwan, ROC b Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan, ROC a r t i c l e i n f o a b s t r a c t Article history: This study investigated the effects of W and Cu on the microstructure of NieWeCu films which are used Received 7 April 2015 as the seed layer in perpendicular magnetic recording (PMR) media. Attributed to the relatively large Received in revised form radius of W, (i) the lattice mismatch between the seed layer and the intermediate layer in PMR, and 28 May 2015 (ii) the grain refining were successfully improved, in the presence of x increased in Ni W Cu (x ¼ 8, 80x x 20 Accepted 29 May 2015 14, 20). In addition, the decayed crystallinity resulting from increasing x value was ameliorated by raising Available online 9 June 2015 y in Ni W Cu (y ¼ 0,