Testable Design of Pipelined Modules by Decomposition.pdfVIP

Testable Design of Pip elined Mo dules by Decomp osition B Steinbach Ch Lang Freib erg University of Mining and Technology Institute of Computer Science D Freib erg Germany email steinblangcinformatiktufreib ergde Abstract x a Circuit optimization by bidecomp osition yields g x x a c f x x x go o d results but is only feasible for small cir a b c x o cuits Therefore large circuits are partitioned into c smaller mo dules b efore decomp osition While bi h x x b c decomp osition pro duces fully testable circuits for x b each mo dule testability of the whole circuit may b e lost In this pap er we demonstrate a decom Figure Decomp osition by Grouping resp ectively p osition scheme where each stage of a pip eline bidecomp osition o f g can b e decomp osed separately Testability of the whole pip eline is maintained through redesign of the stages using the test patterns which were gen decomp osition and EXORdecomp osition in gen erated implicitely during the intial design eral