材料分析测试-Gxrdbd.pdf

X射线衍射分析 金灯仁 参考书：无机非金属材料测试方法 X射线衍射分析原理、方法、应用 （周上祺）等 (英文版) 表4-1 X射线衍射分析方法的应 用 第一章 X射线的性质 • 1.1 引言 • 1.2 X射线的本质 • 1.3 X射线的产生及X射线管 • 1.4 X射线谱 • 1.5 X射线与固体物质相互作用 第一章 X射线的性质 1.1 引言 • 1895，（德，物）伦琴发现X射线 • 1912，（德，物）劳厄发现X射线在晶体 中的衍射 X射线：电磁波 晶体：格子构造； 研究晶体材料开辟道 路 X射线衍射（XRD ）的应用 • 单晶材料：晶体结构；对称性和取向方位 • 金属、陶瓷：物相分析 （定性、定量） • 测定相图或固溶度（定量、晶格常数随固溶 度的变化） • 多晶试样中晶粒大小、应力和应变情况 Structural analysis for materials research and crystallography X-ray powder diffractometry (XRPD) is a valuable tool for the research and development of advanced materials. It can be used for investigation of the following properties: • Identification of the phase(s) present: is it a pure phase or does the material contain impurities as a result of the production process? • Quantification of mixtures of phases • Degree of crystallinity of the phase(s) • Crystallographic structure of the material: space group determination and indexing, structure refinement and ultimately structure solving • Degree of orientation of the crystallites: texture analysis. • Deformation of the crystallites as a result of the production process: residual stress analysis • Influence of non-ambient conditions on these properties All these investigations can be carried out on samples of varying dimensions: Powders, from bulk samples to very small amounts Solid materials of varying shapes and size, such as machined metallic or ceramic components or pills Well plates for combinatorial analysis 入射线 X射线 试样(晶 衍射线 体)？ XRD谱