DPMO_APEX04R.pdfVIP

Defects Per Million Opportunities Project (DPMO) Chair, Tim Kruse, Plexus Corp. Co-Chair, David Mendez, Solectron Corp. February 25, 2004 Agenda ? Project Introduction ? Background Motivation ? Scope of Work ? Database Structure ? Database Statistics ? Lessons Learned ? Future Activities ? Discussion Andy Dugenske Georgia Tech Tim Kruse Plexus Dave Mendez Solectron DPMO Project Participants ? Agilent ? Celestica ? Delphi Automotive ? Georgia Tech ? Hewlett Packard ? Mack Technologies ? Motorola ? Nortel ? Plexus ? Sanmina-SCI ? Shipley ? Solectron ? Teradyne ? Universal ? Vitronics-Soltec Background and Motivation ? The NEMI 2002 Roadmap required conversion cost reduction in the cost per I/O of each electronic assembly over time ? A factor in reducing conversion cost is enabling higher quality, thereby: – Reducing manufacturing costs through higher utilization – Shortening product cycle times – Reducing cost of test and inspection ? With data that quantifies the expected defect spectrum on a PCBA, manufactures can accurately assess: – the cost of assembly, test, repair and scrap – the estimated shipped product quality level of a product DPMO Definition ? DPMO - Defects per Million Opportunities ? Defined in IPC-7912 and IPC-9261 as number of defects divided by number of defect opportunities, multiplied by 106 ? Can be categorized by: – Process (SMT placement, reflow, wave, etc) – Defect type (placement, component, termination, assembly) – Manufacturing line – Package type Background and Motivation Yield vs. Number of Defect Opportunities 0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100% 0 10,000 20,000 30,000 40,000 Defect Opportunities E st im at ed Y ie ld DPMO=10 DPMO=25 DPMO=50 DPMO=100 DPMO=250 DPMO=500 DPMO=1,000 Estimated Yield = e-DPU DPU = DPMO x # of Ops IPC 9621 Purpose The project objective is to provide tools that: – Create an effective environment to continually improve the delivered quality of manufacturing processes – Assist in reducing costs of assembl