CCIMP-HS.PDFVIP

1CCI MP-HS Next generation interferometry at 100 microns/sec. 2Understanding structured surfaces The large field of view and high resolution of the CCI MP-HS enable the understanding of complex structured surfaces. CCI MP-HS: Non-contact 3D optical profiler High speed metrology without compromise ? Scan speed up to 100 microns/second without any loss of data quality ? 1024 x 1024 pixel array for large FOV with high resolution ? 2.2 mm vertical range with closed loop piezoless Z axis scanner ? AutoStitch as standard, measures large parts at high resolution Industry leading data quality ? 0.1 ?ngstrom resolution over the entire measurement range ? 0.2 ?ngstrom RMS repeatability, 0.1% step height repeatability ? Integrated anti vibration for optimum noise performance ? New Claritas 20 light conditioning, increased angle sensitivity improves data quality Robust design ensures low cost of ownership ? Piezoless Z axis scanner eliminates expensive repair bills ? Automatic surface detection prevents crash damage to lens ? New XL option for larger parts without loss of data quality ? Ease of operation reduces the possibility of operator error Windows? 7 (64-bit) software ? Multi-language support including Chinese and Japanese ? Advanced 64-bit AutoStitch offers fast stitching over large areas ? New tools including 4D analysis of 3D surfaces as they evolve over time ? Automatic report generation based on batches of measurement data 3’’ ‘‘ Three elements of surfaces – dimension, form and texture – are critical to the function of a component. Exceptional roughness capability coupled with large area measurement, advanced data analysis (2D and 3D) and Taylor Hobsons expertise provides industry leading metrology. Many users look to CCI MP-HS for solving measurement problems that other instruments simply cannot handle. With outstanding range, resolution and ease of operation, the CCI MP-HS can easily become your ideal tool f