ApplicationNote#128QuantitativeMechanical-Bruker.PDFVIP

Adhesion plus topography of anti-bacterial film Modulus of polymer multilayer Melanin layer of butterfly wing Application Note #128 Quantitative Mechanical Property Mapping at Histogram of modulus from image of polymer blend the Nanoscale with PeakForce QNM The scanning probe microscope (SPM)1 has long been very slow, which makes detailed mapping impractical. To recognized as a useful tool for measuring mechanical solve this problem, Pulsed Force Mode was developed. properties of materials. Until recently though, it has been This approach improves speed by using a relatively fast impossible to achieve truly quantitative material property sinusoidal ramping.3 Unfortunately, this also makes the mapping with the resolution and convenience demanded material property measurements less quantitative. by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, The development of TappingMode™ imaging in 1993 with Bruker’s PeakForce QNM®, it is possible to identify was a key step forward in the functionality of SPM.4 In material variations unambiguously and at high resolution TappingMode the probe is vibrated near the resonant across a topographic image. This application note discusses frequency of the cantilever while it is scanned across the principles and benefits of t