《Nano-imaging through tip-enhanced Raman spectroscopy》.pdfVIP

548 Laser Photonics Rev. 4, No. 4, 548–561 (2010) / DOI 10.1002/lpor.200910039 Abstract The spatial resolution in optical imaging is restricted by so-called diffraction limit, which prevents it to be better than about half of the wavelength of the probing light. Tip- enhanced Raman spectroscopy (TERS), which is based on the SPP-induced plasmonic enhancement and confinement of light near a metallic nanostructure, can however, overcome this bar- rier and produce optical images far beyond the diffraction limit. Here in this article, the basic phenomenon involved in TERS is reviewed, and the high spatial resolution achieved in opti- cal imaging through this technique is discussed. Further, it is shown that when TERS is combined with some other physical phenomena, the spatial resolution can be dramatically improved. 4 nm Particularly, by including tip-applied extremely localized pres- sure in TERS process, it has been demonstrated that a spatial resolution as high as 4 nm could be achieved. Illustration of local deformation in an isolated carbon nanotube sensing this local deformation by means of Raman shift in TERS, due to the pressure applied through the apex of a nano-tip. By the sample can be imaged with extremely high spatial resolution. © 2010 by WILEY-VCH Verlag GmbH Co. KGaA, Weinheim Nano-imaging through tip-enhanced Raman spectroscopy: Stepping beyond the classical limits 1,2,* 1 1 1,3 1,4 Prabhat Verma , Taro Ichimura , Taka-aki Yano , Yuika Saito , and Satoshi Kawata 1 Department of Applied Physics, Osaka University, 2-1, Yamadaoka Suita, Osaka, Japan 2 Dep