Experimental Characterization of Nonlinear Active Microwave Devices资料.pdfVIP

1. Experimental Characterization of Nonlinear Active Microwave Devices Umberto Pisani, Andrea Ferrero, and Gian Luigi Madonna Department of Electronics, Politecnico di Torino, C.so Duca degli Abruzzi, 24 Turin, Italy Tel: +390115644047; Fax: +390115644099; E-mail: pisani@polito.it 1. INTRODUCTION The worldwide diffusion of wireless telecommunication systems opened new perspectives for microwave technologies. High-volume microwave monolithic integrated circuit (MMIC) production became a reality, revolutionizing the approach to microwave-circuit design. Nowadays, this is based on the intensive use of accurate simulation and computer-aided-design (CAD) tools. While scattering parameter measurements provide a reasonable accuracy for circuit modeling for linear operating conditions, large-signal applications still suffer the lack of accurate device models and a reliable experimental procedure. A scheme related to the techniques and measurement systems for device and circuit microwave characterization is shown in Figure 1. LINEAR NON-LINEAR CHARACTERIZATION CHARACTERIZATION LOAD-PULL NON-LINEAR S-PARAMETERS CHARACTERIZATION MODELS MICROWAVE E TWO-PORT NETWORK N N TRANSITION Y O ANALYSIS NETWORK D I ANALYZER T ANALYZER-BASED O C T R E